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US 2002/0153914 A1Published application
AC testing of leakage current
AssigneeIntel Corporation
InventorsTawfik R. Arabi, Gregory F. Taylor, Srirama Pedarla, Patrick Elwer, Dan Murray
Life of this patent
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Abstract
A method of leakage test for an integrated circuit by sampling the RC time constant of leakage current of the pins of the integrated circuit.
Claims30
A method of testing an integrated circuit (IC), the method comprising:
- driving a terminal on the IC to a state;
- stopping the driving of the terminal;
- floating the terminal for a predetermined time;
- and
- determining a state of the terminal after the predetermined time.
2 more elements
A method of testing comprising:
- charging a pin on an integrated circuit (IC) until it reaches a known state;
- stopping the charging of the pin;
- floating the pin for a predetermined time;
- sampling a state of the pin after the predetermined time;
- and
- determining a test result of the pin based on the state of the pin after the predetermined time, wherein the method is performed with Boundary Scan.
3 more elements
A method of testing comprising:
- driving the first terminal on an integrated circuit (IC) to a first state;
- driving the second terminal on the IC to a second state;
- stopping the driving of at least one of the terminals;
- floating at least one of the terminals for a predetermined time;
- and
- determining a state of at least one of the terminals after the predetermined time.
3 more elements
A method of testing comprising:
- charging the first pin on an integrated circuit (IC) to a first known state;
- charging the second pin on the IC to a second known state;
- stopping the charging of at least one of the pins;
- floating at least one of the pins for a predetermined time;
- sampling a state of at least one of the pins after the predetermined time;
- and
- determining a test result of at least one of the pins based on the state of at least one the pins after the predetermined time, wherein the method is performed with Boundary Scan.
4 more elements
A method of testing a circuit module, the method comprising:
- tri-stating all of the terminals on any of the integrated circuits (ICs) connected to a net, the ICs located on the same circuit module, and wherein the ICs includes different types of ICs and perform different functions,
- driving the net to a state through a terminal on one or more of the ICs;
- stopping the driving of the terminal;
- floating the net for a predetermined time;
- and
- determining a state of the net after the predetermined time, wherein the method is performed with Boundary Scan.
3 more elements
An apparatus comprising:
- an integrated circuit (IC);
- and
- a tester connected to the IC, wherein the tester performs leakage test on the IC by a method of:
- driving the terminal of an IC to a state;
- stopping the driving of the terminal;
- floating the terminal for a predetermined time;
- and
- determining a state of the terminal after the predetermined time.
5 more elements
An apparatus comprising:
- an integrated circuit (IC);
- and
- a tester connected to the IC, wherein the tester performs a leakage test on the IC by a method of:
- driving the first terminal of an IC to a first state;
- driving the second terminal of an IC to a second state;
- stopping the driving of at least one of the terminals;
- floating at least one of the terminals for a predetermined time;
- and
- determining a state of at least one of the terminals after the predetermined time, wherein the method is performed with Boundary Scan.
6 more elements
A machine-readable medium having instructions stored thereon capable of causing a tester to perform method of testing, the method comprising:
- charging the pin of an integrated circuit (IC) until it reaches a known state;
- stopping the charging of the pin;
- floating the pin for a predetermined time;
- sampling a state of the pin after the predetermined time;
- and
- determining a test result of the pin based on the state of the pin after the predetermined time.
3 more elements
Dependencies are inferred from the claim text.