Apparatus and method for detecting electromagnetic wave source, and method for analyzing the same
AssigneeHitachi, Ltd.
InventorsKouichi Uesaka, Kenichi Shinbo
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AssigneeHitachi, Ltd.
InventorsKouichi Uesaka, Kenichi Shinbo
Estimating the term…
There are provided electromagnetic wave source detecting apparatus and method as well as electromagnetic wave source analyzing system and method which can detect and analyze a source of (electromagnetic disturbing wave) representing a main factor in generating an electromagnetic field remotely of the apparatus in order to suppress the electromagnetic field intensity at the remote distance from the apparatus to below a regulated value. In the present invention, a magnetic field near an object 110 to be measured is measured by a set of at least two or more probes 101 and 102, a position of an electromagnetic wave source is detected through simplified calculation of one function using a phase difference between the two probes, a current distribution on the measured object is determined by solving simultaneous equations containing the position information and magnitudes of measured magnetic fields and an electromagnetic field at a remote distance from the apparatus is determined from the current distribution, thereby identifying the source representing the main factor in generating the electromagnetic field remotely of the apparatus.
An electromagnetic wave source detecting apparatus comprising:
An electromagnetic wave source detecting apparatus comprising:
An electromagnetic wave source detecting apparatus comprising:
An electromagnetic wave source detecting method comprising the steps of measuring intensities of an electromagnetic field generated from an object to be measured of an electronic apparatus at each measuring position which changes twoIdimensionally along a measured object plane near the measured object by using a plurality of probes,
An electromagnetic wave source detecting method comprising the steps of measuring intensities of an electromagnetic field generated from an object to be measured of an electronic apparatus at each measuring position which changes two-dimensionally along a measured object plane near the measured object by using a plurality of probes,
Dependencies are inferred from the claim text.