Semiconductor device
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsGourab Majumdar, Shinji Hatae, Akihisa Yamamoto
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Abstract
In a semiconductor substrate (100), semiconductor regions (1, 2, 3, 5) belonging to the IGBT are formed in an IGBT region (20) and semiconductor regions (1, 4) belonging to the diode are formed in a diode region (21). The IGBT and the diode are connected in anti-parallel to each other. A trench (15) in which an insulator (16) is buried is formed between the IGBT region (20) and the diode region (21). The insulator (16) restricts the reverse recovery current which flows from the diode region (21) into the IGBT region (20). Thus, semiconductor regions of an IGBT and a diode connected in anti-parallel with each other are fabricated in a single semiconductor substrate and the chip size is reduced.
Claims6
A semiconductor device comprising a vertical IGBT and a vertical diode which are connected in anti-parallel with each other, wherein a plurality of semiconductor regions belonging to said IGBT and said diode are fabricated in a single semiconductor substrate,
- wherein said semiconductor substrate comprises a pair of main surfaces, wherein among said plurality of semiconductor regions, ones that belong to said IGBT are formed in an IGBT region selectively defined along said pair of main surfaces, and ones that belong to said diode among said plurality of semiconductor regions are formed in a diode region selectively defined in a region different from said IGBT region along said pair of main surfaces, and wherein said semiconductor substrate further comprises an electrically insulating partition member selectively formed between said IGBT region and said diode region, for restricting a current flowing from one of said IGBT region and said diode region into the other.
Dependencies are inferred from the claim text.