Testing resistance bolometer arrays
AssigneeInfrared Integrated Systems Limited
InventorsStephen George Porter, John Fox, Bhajan Singh
Life of this patent
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Abstract
A method of testing resistance bolometer arrays involves applying different voltages to different bolometers so as to produce a detectable difference between adjacent bolometers under normal conditions. The voltages may be applied in a recognisable pattern so that faults can be readily identified from a visual display of the array.
Claims16
A circuit comprising an array of resistance bolometer detector elements, a voltage source applying a voltage across each detector element, means for detecting infrared radiation by sensing and detecting a voltage and/or current change at a circuit connection node associated with each detector element, and means for testing the detector elements and/or their associated circuitry by applying at least two different voltages to the detector elements whereby each element is supplied by a different voltage to at least one of its immediate neighbours.
A method of testing an array of resistance bolometer detector elements having means for detecting infrared radiation by sensing and detecting a voltage and/or current change at a circuit connection node associated with each detector element, the method comprising applying at least two different voltages to the elements of the array so that each element is supplied by a different voltage to at least one of its immediate neighbours.
Dependencies are inferred from the claim text.