Back to results
US 2002/0152795 A1Published application
Macroscopic model of scanning force microscope
AssigneeUniversity of Puerto Rico
InventorsClaudio Guerra-Vela, Fredy R. Zypman
Life of this patent
Estimating the term…
Loading patent…
Loading patent…
AssigneeUniversity of Puerto Rico
InventorsClaudio Guerra-Vela, Fredy R. Zypman
Estimating the term…
A macroscopic version of the Scanning Force Microscope is described. It consists of a cantilever under the influence of external forces, which mimic the tip-sample interactions. The use of this piece of equipment is threefold. First, it serves as direct way to understand the parts and functions of the Scanning Force Microscope, and thus it is effectively used as an instructional tool. Second, due to its large size, it allows for simple measurements of applied forces and parameters that define the state of motion of the system. This information, in turn, serves to compare the interaction forces with the reconstructed ones, which cannot be done directly with the standard microscopic set up. Third, it provides a kinematics method to non-destructively measure elastic constants of materials, such as Young's and shear modules, with special application for brittle materials.
A method of determining the vibrational modes of a cantilever to improve the accuracy of a scanning force microscope comprising the steps of:
A method of determining the resonant frequencies of a cantilever comprising the steps of:
A measurement device configured to detect the resonant frequencies of a cantilever comprising:
Dependencies are inferred from the claim text.