Electrical test adapter

Abstract

An electrical test adaptor comprises a pair of spaced apart elongate conductive probes supported on an insulating base, and a moveable deflector part comprising at least one cam surface adapted to bear on at least one of the probes when the deflector is in a closed position, thereby to deflect the probe from a non-contact position into a contact position. The contact position can be one in which the conductive probes are closer than in the non-contact position, and the deflector ideally has a pair of cam surfaces, each adapted to bear on one of the conductive probes. Further, an electrical test adaptor comprises a pair of elongate conductive probes supported on an insulating base, and a moveable locking part adapted to move between (i) an open position and (ii) a closed position in which the locking part is closer to the conductive probes than in the open position, the locking part having a retention surface facing the base. The retention surface can be a side of an aperture formed in the locking part. The base and the locking part/deflector can be hingedly attached, having gripping surfaces on outer faces thereof such that compression of the respective gripping surfaces causes the parts to rotate relative to each other by way of the hinge.

Dependencies are inferred from the claim text.