Loading patent…
AssigneeLeica Microsystems Inc.
InventorRoger Spink
Estimating the term…
A device for controlling a characteristic of an image signal superimposed on a specimen image includes: a main optical system configured to refract light emitted from a specimen into a main beam path; a superimposition apparatus in a fixed relationship to the main optical system, configured to generate the image signal; a superimposing reflector configured to reflect the image signal generated by the superimposition apparatus into the main beam path and to superimpose the image signal onto the specimen image; an image measurement unit in a fixed relationship to the main optical system configured to measure a characteristic of the specimen image; and a controller configured to adjust a characteristic of the image signal generated by the superimposition apparatus in response to a measurement by the image measurement unit. The characteristic of the specimen image and the characteristic of the image signal may be brightness, color, or contrast.
A device for controlling a characteristic of an image signal superimposed on a specimen image, comprising:
A method for controlling a characteristic of an image signal superimposed on a specimen image, comprising:
A device for controlling a characteristic of an image signal superimposed on a specimen image, comprising:
Dependencies are inferred from the claim text.