Low power comparator comparing differential signals

An analog front end (AFE) receiving a sequence of voltages representing the corresponding charges stored in a plurality of pixels contained in an image sensor, said AFE generating a plurality of digital values representing said sequence of voltages, said AFE comprising:

• a sampler receiving the charge stored in said plurality of pixels and generating a voltage level corresponding to each charge, said voltage level being generated after correction according to a previous offset;
• a programmable gain amplifier (PGA) amplifying said voltage level to generate an amplified voltage level;
• an analog to digital converter (ADC) converting said amplified voltage level to a digital value, said ADC containing a comparator circuit for comparing a differential input voltage representing a charge in one of said plurality of pixels, said differential input voltage signal being represented by a differential reference voltage, wherein said differential input signal is represented by a negative single ended input signal (INM) and a positive single ended input signal (INP), said differential reference voltage being represented by a negative reference signal (REFM) and a positive reference signal (REFP), said comparator circuit comprising:
• a first regenerative latch coupled between a first node and a second node;
• a second regenerative latch coupled between a third node and a fourth node, said first node being connected to said third node by a first φZ switch and said second node being connected to said fourth node by a second φZ switch, said first regenerative latch being enabled and disabled according to a first φZD switch and said second regenerative latch being enabled and disabled according to a second φZD switch;
• a first capacitor having a first terminal and a second terminal, said first terminal of said first capacitor being coupled to said REFP via a first φ switch, said first terminal of said first capacitor also being coupled to said first node;
• a second capacitor having a first terminal and a second terminal, said first terminal of said second capacitor being coupled to said INP via a second φ switch, said first terminal of said second capacitor also being coupled to said second node;
• a third capacitor having a first terminal and a second terminal, said first terminal of said third capacitor being coupled to said INM via a third φ switch, said first terminal of said third capacitor also being coupled to said third node;
• a fourth capacitor having a first terminal and a second terminal, said first terminal of said fourth capacitor being coupled to said REFM via a fourth φ switch, said first terminal of said fourth capacitor also being coupled to said fourth node;
• wherein said four φ switches are closed during a sample phase to cause said four capacitors to be charged by a voltage level provided on the corresponding one of the INP, INM, REFM, and REFP signals,
• wherein said first φZ switch is closed during an average phase to cause the voltages across said first node and said second node to be averaged to generate a first average voltage, said second φZ switch also being closed during said hold phase to cause the voltages across said second node and said fourth node to be averaged to generate a second average voltage, and
• wherein said first and second φZD switches are closed during a hold phase to cause said regenerative latches to generate a difference of said first average voltage and said second average voltage, said first regenerative latch and said second regenerative latch amplifying said difference to generate an output signal representing the result of comparison of said differential input signal and said differential reference signal,
• wherein said output signal represents a bit of one of said digital values.

A device receiving light from an image, and generating a plurality of digital values representing said image based on said light, said device comprising:

• an image sensor containing a plurality of pixels, each of said plurality of pixels generating a charge proportionate to incident light and time of incidence of light, wherein said light from said image is incident on said image sensor;
• an analog front end (AFE) receiving a sequence of voltages representing the corresponding charges stored in said plurality of pixels, said AFE generating said plurality of digital values representing said sequence of voltages, said AFE comprising:
• a sampler receiving the charge stored in said plurality of pixels and generating a voltage level corresponding to each charge, said voltage level being generated after correction according to a previous offset;
• a programmable gain amplifier (PGA) amplifying said voltage level to generate an amplified voltage level;
• an analog to digital converter (ADC) converting said amplified voltage level to a digital value, said ADC containing a comparator circuit for comparing a differential input voltage representing a charge in one of said plurality of pixels, said differential input voltage signal being represented by a differential reference voltage, wherein said differential input signal is represented by a negative single ended input signal (INM) and a positive single ended input signal (INP), said differential reference voltage being represented by a negative reference signal (REFM) and a positive reference signal (REFP), said comparator circuit comprising:
• a first regenerative latch coupled between a first node and a second node;
• a second regenerative latch coupled between a third node and a fourth node, said first node being connected to said third node by a first φZ switch and said second node being connected to said fourth node by a second φZ switch, said first regenerative latch being enabled and disabled according to a first φZD switch and said second regenerative latch being enabled and disabled according to a second φZD switch;
• a first capacitor having a first terminal and a second terminal, said first terminal of said first capacitor being coupled to said REFP via a first φ switch, said first terminal of said first capacitor also being coupled to said first node;
• a second capacitor having a first terminal and a second terminal, said first terminal of said second capacitor being coupled to said INP via a second φ switch, said first terminal of said second capacitor also being coupled to said second node;
• a third capacitor having a first terminal and a second terminal, said first terminal of said third capacitor being coupled to said INM via a third φ switch, said first terminal of said third capacitor also being coupled to said third node;
• a fourth capacitor having a first terminal and a second terminal, said first terminal of said fourth capacitor being coupled to said REFM via a fourth φ switch, said first terminal of said fourth capacitor also being coupled to said fourth node;
• wherein said four φ switches are closed during a sample phase to cause said four capacitors to be charged by a voltage level provided on the corresponding one of the INP, INM, REFM, and REFP signals,
• wherein said first φZ switch is closed during an average phase to cause the voltages across said first node and said second node to be averaged to generate a first average voltage, said second φZ switch also being closed during said hold phase to cause the voltages across said second node and said fourth node to be averaged to generate a second average voltage, and
• wherein said first and second φZD switches are closed during a hold phase to cause said regenerative latches to generate a difference of said first average voltage and said second average voltage, said first regenerative latch and said second regenerative latch amplifying said difference to generate an output signal representing the result of comparison of said differential input signal and said differential reference signal,
• wherein said output signal represents a bit of one of said plurality of digital values.

A circuit for comparing an input differential signal with a reference differential signal, each differential signal being represented by a pair of single ended inputs, said circuit comprising:

• means for adding a first one of said pair of single ended inputs related to said input differential signal to a first one of said pair of single ended inputs related to said reference differential signal to generate a first added signal;
• means for adding a second one of said pair of single ended inputs related to said input differential signal to a second one of said pair of single ended inputs related to said reference differential signal to generate a second added signal;
• means for generating a difference of said first added value and said second added value;
• and
• means for amplifying said difference to generate an amplified signal representing the result of comparison of said reference differential signal and said input differential signal.

A method of comparing an input differential signal with a reference differential signal, each differential signal being represented by a pair of single ended inputs, said method comprising:

• adding a first one of said pair of single ended inputs related to said input differential signal to a first one of said pair of single ended inputs related to said reference differential signal to generate a first added signal;
• adding a second one of said pair of single ended inputs related to said input differential signal to a second one of said pair of single ended inputs related to said reference differential signal to generate a second added signal;
• generating a difference of said first added value and said second added value;
• and
• amplifying said difference to generate an amplified signal representing the result of comparison of said reference differential signal and said input differential signal.