Transistor device testing employing virtual device fixturing
AssigneeEricsson Inc.
InventorSteven J. Laureanti
Life of this patent
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Abstract
Virtual device fixturing is used to test transistor products, such as LDMOS power amplifier products, in the final packaging and testing stage of device fabrication. The input and output impedance transformation networks of a typical test fixture are implemented in software. The impedance matching function, normally performed by the physical input and output impedance transformation networks of the fixture, is supplanted by de-embedded scatter parameter calibration files. Test equipment, such as a vector network analyzer, attaches to a universal test fixture, while the software scatter parameter components are responsible for making the calibrations necessary to present the device under test with a matching low impedance.
Claims20
A method for testing a transistor device, comprising:
- measuring small signal scatter parameters of the device;
- measuring a performance characteristic of the device;
- transforming the measured performance characteristic based on the measured small signal scatter parameters.
A system for testing a transistor device, comprising:
- a test station having an input for coupling to a input terminal and an output for coupling to an output terminal, respectively, of the transistor device;
- a network analyzer coupled to the test station for measuring small signal scatter parameters and for measuring a performance characteristic of the device;
- and
- a processor coupled to the network analyzer, the processor configured for transforming the measured performance characteristic based on the measured small signal scatter parameters.
Dependencies are inferred from the claim text.