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US 2002/0118033 A1Published application
IC tester and method of cooling the IC tester
OwnerHiromichi Koideinventor
Life of this patent
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Abstract
An IC tester and a method of cooling the IC tester capable of reducing an installing space of the IC tester. The IC tester has circulating means for circulating cooling air therein, thereby cooling heating elements.
Claims6
An IC tester having circulating means for circulating cooling air therein, thereby cooling heating elements mounted therein.
A method of cooling an IC tester comprising circulating cooling air in the IC tester, thereby cooling heating elements mounted therein.
Dependencies are inferred from the claim text.