Apparatuses and methods for determining if protective coatings on semiconductor substrate holding devices have been compromised
AssigneeMicron Technology, Inc.
InventorTerry Gilton
Life of this patent
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AssigneeMicron Technology, Inc.
InventorTerry Gilton
Estimating the term…
In one aspect, the invention includes an apparatus comprising a semiconductor substrate receiving device with at least one extension configured to hold a semiconductor substrate within a liquid bath. The device is configured to have at least a portion of the extension at least periodically placed within the liquid bath. The extension comprises a conductive material at least partially coated with an insulative protective material. The insulative protective material is configured to protect the portion of the conductive material which is in the bath from physically contacting the liquid of the bath. The apparatus also comprises an electrode within the bath, and an electrical connection between the electrode and the conductive material of the extension. Additionally, the apparatus comprises a monitor configured to monitor a current flow state of a circuit comprising the electrode, conductive material of the extension, and liquid bath to determine if the circuit is in a closed state or in an open state. In another aspect, the invention includes methods for determining if a protective coating on a semiconductor substrate receiving device has been compromised.
An apparatus configured to measure an electrical conductivity between an insulatively coated conductive device and an electrolytic bath within which the device is submerged to determine if the insulative coating has been compromised.
An apparatus configured to measure an electrical conductivity between an insulatively coated conductive semiconductor substrate receiving device and a bath within which the device is submerged to determine if the insulative coating has been compromised.
An apparatus configured to determine if a protective coating on a semiconductor substrate receiving device has been compromised, comprising:
An apparatus configured to determine if a protective coating on the semiconductor substrate lifting device has been compromised, comprising:
A method for determining if an insulative coating over a conductive semiconductor substrate receiving device has been compromised, comprising measuring a current between the conductive semiconductor substrate receiving device and a bath within which the device is submerged.
A method for determining if a protective coating on a semiconductor substrate receiving device has been compromised, comprising:
A method for determining if a protective coating on a semiconductor substrate receiving device has been compromised, comprising:
Dependencies are inferred from the claim text.