Frequency domain reflection measurement device
AssigneeTektronix, Inc.
InventorThomas C. Hill
Life of this patent
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Abstract
A frequency domain measurement device multi-phase modulates an RF frequency signal with a broadband signal, such as a pseudo random number, to produce an RF spread spectrum signal that encompasses a frequency range of interest. The RF spread spectrum signal is transmitted to a device under test, and a corresponding reflected signal from the device under test is correlated with the RF spread spectrum signal to produce information from which location of and distance to a fault in the device under test may be determined. A FIR filter is used as part of the correlation process to determine magnitude and phase versus frequency over the frequency range of interest for the device under test as well as location of and distance to the fault.
Claims8
A frequency domain reflection measurement device comprising:
- means for generating an RF spread spectrum signal covering a frequency range of interest for transmission to a device under test;
- and
- means for correlating a return signal from the device under test with a modulating signal used to generate the RF spread spectrum signal to detect the location of and distance to a fault in the device under test.
A method of locating and determining distance to a fault in a device under test comprising the steps of:
- generating an RF spread spectrum signal covering a frequency range of interest for injection into the device under test;
- and
- correlating a return signal from the device under test with a modulating signal used in the generating step to produce the RF spread spectrum signal to detect the location of and distance to a fault in the device under test.
Dependencies are inferred from the claim text.