Method for measuring the thickness of multi-layer films
AssigneePlast-Control Gerätebau GmbH
InventorsFrank Muller, Stefan Konermann, Norbert Sappelt
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Abstract
A method for capacitively measuring the thickness of multi-layer films (10), the layers (32, 34) the dielectric constants of which differ at least at a particular temperature, wherein, in addition to the capacitive measurement, at least one further thickness measurement is carried out under different conditions, and wherein the thicknesses (d1, d2) of the individual layers is determined by comparing the measurement results and by means of the different dielectric constants.
Claims10
A method for capacitively measuring the thickness of multi-layer films (10), the layers (32, 34) the dielectric constants of which differ at least at a particular temperature, wherein, in addition to the capacitive measurement, at least one further thickness measurement is carried out under different conditions, and wherein the thicknesses (d1, d2) of the individual layers is determined by comparing the measurement results and by means of the different dielectric constants.
The method of one of the preceding claims, wherein at least one capacitor measurement is carried out with the help of a measuring head (28;
- 28′), the capacitive plates (38) of which are disposed on the same side of the multi-layer film (10) and at right angles to the latter.
The method of one of the preceding claims, wherein at least one capacitive measurement is carried out with a measuring head (44), the capacitor plates (46) of which are disposed on either side of the multi-layer film (10) and parallel to the latter.
The method of one of the preceding claims, wherein the multi-layer film (10) contains at least one layer (32) of ethylene vinyl alcohol.
The method of one of the preceding claims, wherein the multi-layer film (10) contains at least one layer of polyamide.
The method of one of the preceding claims, wherein the multi-layer film (10) contains at least one layer (34) of polyethylene.
The method of one of the preceding claims, wherein the capacitive measurement of the thickness and the measurement of the temperature of the film are carried out at the same place.
Dependencies are inferred from the claim text.