US 2002/0056060 A1 · Physical layer device testing method, physical layer device with test circuits, and transmitting/receiving circuit with test circuits

Abstract

A physical layer device 21 includes a link layer interface 2, a physical layer logic circuit 3, and ports 4 to 6. In addition to these components, the physical layer device 21 includes therein a test link layer circuit 22, a test physical layer logic circuit 23, and switches 24 to 26 in order to test the operation of the physical layer logic circuit 3 and the ports 4 to 6. In testing, the ports 4 to 6 are externally connected by a cable 27, and contacts of the switches 24 to 26 are switched. Accordingly, the physical layer logic circuit 3 is connected to the test link layer circuit 22, and the ports 5 and 6 are connected to the test physical layer logic circuit 23. According to the present invention, testing can be performed by a physical layer device alone, thus reducing the test time and the test cost.

Claims13

Dependent claims

A method for testing a physical layer device including a link layer interface, a physical layer logic circuit to be connected to said link layer interface, and a plurality of ports to be connected to said physical layer logic circuit, said method characterized in that:

a test link layer circuit to be interrelated to said link layer interface and a test physical layer logic circuit to be interrelated to said physical layer logic circuit are provided beforehand in said physical layer device;
in testing, said test link layer circuit is connected to said physical layer logic circuit through said link layer interface, and said test physical layer logic circuit is connected to said physical layer logic circuit through said plurality of ports;
and
said link layer interface, said physical layer logic circuit, and said plurality of ports are tested.

1 more element

A transmitting/receiving circuit with test circuits, said transmitting/receiving circuit including a set of a first driver and a first receiver and another set of a second driver and a second receiver, characterized by comprising:

test data storage means for storing test data;
selection means for selecting inputting of the test data to said first driver or said second driver;
and
comparison means for comparing, when said first receiver and said second receiver each receive the test data transmitted by said first driver, each of the received test data with the test data stored in said test data storage means and for comparing, when said second receiver receives the test data transmitted by said second driver, the received test data with the test data stored in said test data storage means.

1 more element

Dependencies are inferred from the claim text.

Physical layer device testing method, physical layer device with test circuits, and transmitting/receiving circuit with test circuits

Life of this patent

Physical layer device testing method, physical layer device with test circuits, and transmitting/receiving circuit with test circuits

Life of this patent

Abstract

Claims13