Local heating of memory modules tested on a multi-motherboard tester

A memory-module tester comprising:

• a robotic device that moves memory modules from an input stack of untested memory modules to an output stack of tested memory modules;
• a host computer for controlling the robotic device;
• a plurality of test stations for testing memory modules that are loaded and unloaded by the robotic device, each test station comprising:
• a test socket mounted on a test adaptor board, the test socket for receiving a memory module inserted by the robotic device;
• a motherboard for a personal computer, the motherboard executing a test program in response to commands from the host computer, the test program testing the memory module inserted into the test socket;
• a mounting board for supporting the motherboard from a first surface, the mounting board having an opening to allow the robotic device to reach the test socket from a second surface opposite the first surface of the mounting board;
• and
• a heating device, mounted on the first surface of the mounting board, for heating the memory module inserted into the test socket;
• wherein the mounting board thermally isolates the motherboard from the heating device,
• whereby memory modules tested by the motherboards are heated by the heating device on the mounting board while the motherboards are thermally isolated.

A multiple-motherboard temperature-controlled memory tester comprising:

• main system means for controlling testing of memory modules on multiple motherboards;
• motherboard means, controlled by the main system means, for executing a test program on a memory module inserted into a test socket means;
• test adaptor board means, mounted on the motherboard means, for electrically connecting the test socket means to a memory bus means on the motherboard;
• local temperature means, near each the test adaptor board means, for establishing and maintaining the memory module inserted into the test socket means at a target test temperature while the motherboard means executes the test program on the memory module inserted into the test socket means;
• wherein the multiple-motherboard temperature-controlled memory tester has a plurality of the motherboard means, each motherboard means having an attached test adaptor board means with a test socket means and a local temperature means, each motherboard means for executing the test program on a different memory module in parallel with other motherboard means, whereby parallel testing of memory modules at the target test temperature is performed.