Unit with inspection probe blocks mounted thereon in parallel
AssigneesSoshotech Co., Ltd., Adtec Engineering Co., Ltd.
InventorsToshio Okuno, Masatomo Nagashima, Atsushi Oguma, Tadashi Furumi
Life of this patent
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AssigneesSoshotech Co., Ltd., Adtec Engineering Co., Ltd.
InventorsToshio Okuno, Masatomo Nagashima, Atsushi Oguma, Tadashi Furumi
Estimating the term…
To provide a unit with inspection block blocks mounted thereon in parallel, wherein a plurality of inspection probe blocks are inserted into and removed from a guide rail through a slider so that the probe blocks can be loaded or replaced. Each probe block is slidingly moved along the guide rail so that its positional adjustment can be made in an extension length of the guide rail. Only one kind of support base can commonly be used by inserting and removing different probe blocks with respect to the support base and the positional adjustment can be done. The unit with inspection probe blocks mounted thereon in parallel comprises a support base 1 and a plurality of inspection probe blocks 3 each having a plurality of blocks 2 and arranged on the support base 1 in parallel, the probes 2 of each inspection probe block 3 being contacted with electrodes 5 of a display panel or wiring circuit board 4 so that inspection can be carried out, wherein a guide rail 7 is disposed on the support base 1, the inspection probe blocks 3 are slidably fitted to the guide rail 7 through a slider 8, and each inspection probe block 3 is fixed to the support base 1 at a predetermined slide position.
A unit with inspection probe blocks mounted thereon in parallel comprising a support base and a plurality of inspection probe blocks each having a plurality of blocks and arranged on said support base in parallel, said probes of each inspection probe block being contacted with electrodes of a display panel or wiring circuit board so that inspection can be carried out, wherein a guide rail is disposed on said support base, said inspection probe blocks are slidably fitted to said guide rail through a slider, and each inspection probe block is fixed to said support base at a predetermined slide position.
Dependencies are inferred from the claim text.