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US 2001/0055784 A1Published application
Quantitative analysis
AssigneeARKRAY, Inc.
InventorsYuichiro Noda, Yoshiyuki Tanaka, Konomu Hirao
Life of this patent
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AssigneeARKRAY, Inc.
InventorsYuichiro Noda, Yoshiyuki Tanaka, Konomu Hirao
Estimating the term…
Amounts of components in a specimen can be analyzed with excellent quantitativity. The analysis includes: measuring an amount of a component to be analyzed in a specimen; measuring an amount of a standard component present originally and homeostatically in the specimen other than the component to be analyzed; determining the amount of the specimen from the amount of the standard component thus measured and a known concentration of the standard component in the specimen; and determining a concentration of the component to be analyzed in the specimen from the amount of the specimen thus determined and the amount of the component to be analyzed thus measured. The quantitative analysis of the present invention allows a component to be analyzed to be measured with high quantitativity as shown in FIG. 1.
A quantitative analysis for measuring a concentration of a component to be analyzed in a specimen, comprising:
Dependencies are inferred from the claim text.