Multi-process display method in debugger system
AssigneeHitachi, Ltd.
InventorToshihiro Tsurugasaki
Life of this patent
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Abstract
In a multi-process display method of displaying processes to be debugged in a debugger system, an operation state change and detailed information of each process are acquired, each process is displayed using a predetermined pattern, a relationship between the processes is displayed using a layout of patterns and lines therebetween, the current operation state of each process is displayed using a particular display mode for the pattern, and the detailed information of each process is displayed.
Claims10
A multi-process display method of displaying processes to be debugged in a debugger system;
- comprising the steps of:
- acquiring an operation state change of each process into the debugger system;
- representing each process using a predetermined pattern;
- representing a relationship between the processes using a layout of patterns and lines therebetween;
- and
- representing the operation state of each process using a particular display mode for the pattern.
A debugger system, comprising:
- means for acquiring an operation state change of each process of multiple processes to be debugged;
- and
- pattern display means for displaying each process using a predetermined pattern, displaying a relationship between the processes using a layout of patterns and lines therebetween, and displaying the operation state of each process using a particular display mode for the pattern.
A program storage device readable by a machine, tangibly embodying a program of instructions executable by the machine to perform method steps for debugging multi-process, said method steps comprising steps of:
- acquiring an operation state change and detailed information of each process;
- displaying each process using a predetermined pattern;
- displaying a relationship between the processes using a layout of patterns and lines therebetween;
- displaying the operation state of each process using a particular display mode for the pattern;
- and
- displaying the detailed information of each process.
Dependencies are inferred from the claim text.