Device for testing and calibrating the oscillation frequency of an integrated oscillator

A method of testing and calibrating an oscillation frequency of an integrated oscillator circuit in an integrated circuit, comprising:

• starting the test and calibration operation;
• initiating the integrated oscillator circuit;
• setting a frequency selection signal to a nominal value;
• setting a counter of clock pulses to a zero starting value;
• initiating a reference signal of known duration generated by an internal generator;
• checking the level of said reference signal by means of an internal circuit of a testing and calibrating device that is responsive to a change-over edge of said reference signal from a starting value;
• and
• incrementing the clock pulse counter, and going back to checking step F7.

A testing and calibration system for use in conjunction with a semiconductor integrated oscillator, comprising:

• a memory and a control circuit;
• a plurality of connection members, including first, second, third and fourth connection members associated with the memory and the control circuit;
• a reference signal generator coupled to the first connection member and configured to output a reference signal of known duration;
• a testing and calibration circuit having first and second inputs to receive first and second testing values, a first output adapted to be coupled to the second connection member for sending testing and calibration control signals to the control circuit;
• a second output coupled to the third connection member for sending frequency change signals to the control circuit, and a third input coupled to the fourth connection member for receiving a result signal from the control circuit.

A testing and calibration system for use in conjunction with a semiconductor integrated oscillator, comprising:

• a memory and a control circuit coupled to the memory;
• a plurality of connection members, including first, second, third and fourth connection members association with the control circuit;
• a reference signal generator coupled to the first connection member and configured to output a reference signal of known duration;
• and
• a testing and calibration circuit having first and second inputs to receive a minimum and maximum testing value, respectively, a first output coupled to the second connection member for sending testing and calibration control signals;
• a second output coupled to the third connection member for sending the minimum and maximum testing values, and a third input coupled to the fourth connection member for receiving a result signal.