Semiconductor device
AssigneeMatsushita Electric Industrial Co., Ltd.
InventorsHidefumi Otsuka, Tomonori Fujimoto
Life of this patent
Estimating the term…
Abstract
A semiconductor integrated circuit includes a plurality of semiconductor memory devices implemented as DRAMs and an output selector on the same chip. External terminals of the chip include: terminals for inputting an inverted row address strobe signal /RAS to the respective semiconductor memory devices individually; and common terminals for inputting PRAUT, SLF, /CAS, ADR, /WE, /OE, CLK and TMODE signals to all the memory devices. The output signals TDQ, SRAS, MOUT and BITST of the semiconductor memory devices are controlled by the output selector, passed through a common test bus and then output from a common external terminal.
Claims6
A semiconductor device comprising:
- a plurality of DRAMs and logic circuits integrated together on a single semiconductor substrate, each said DRAM including a plurality of memory cells;
- a plurality of first terminals, each said first terminal independently providing a corresponding row address strobe signal to associated one of the DRAMs;
- a second terminal receiving an auto refresh control signal for all the memory cells in the respective DRAMs;
- and
- means for selectively generating an internal auto refresh control signal or an internal row address strobe signal from the corresponding row address strobe signal depending on whether the auto refresh control signal is asserted or negated, the generating means being provided for each said DRAM and connected to associated one of the first terminals and to the second terminal.
A semiconductor device comprising:
- a plurality of DRAMs and logic circuits integrated together on a single semiconductor substrate, each said DRAM including a plurality of memory cells and generating a self-refresh row address strobe signal to access a desired one of the memory cells responsive to a self-refresh control signal;
- a data bus for inputting or outputting data to/from the DRAMs therethrough;
- and
- means for selectively outputting the self-refresh row address strobe signal to the data bus.
A semiconductor device comprising:
- a plurality of DRAMs and logic circuits integrated together on a single semiconductor substrate, each said DRAM including a plurality of memory cells and internally generating a pass/fail flag signal representing a test result;
- a data bus for inputting or outputting data to/from the DRAMs therethrough;
- and
- means for selectively outputting the pass/fail flag signal to the data bus.
Dependencies are inferred from the claim text.