Measuring chip

A measuring chip which is used in a surface plasmon resonance sensor comprising

• a dielectric block,
• a metal film layer which is formed on a first face of the dielectric block and is brought into contact with a sample,
• a light source which emits a light beam,
• an optical system which causes the light beam to enter the dielectric block through a second face thereof so that the light beam is reflected in total internal reflection at the interface of the dielectric block and the metal film and various angles of incidence of the light beam to the interface of the dielectric block and the metal film can be obtained, and
• a photodetector means which detects attenuation in total internal reflection due to plasmon resonance by detecting the intensity of the light beam which is reflected in total internal reflection and goes outside the dielectric block through a third face thereof,
• the measuring chip comprising a single dielectric block having all the first to third faces and the metal film layer integrally formed on the first face of the dielectric block.

A measuring chip which is used in a leaky mode sensor comprising

• a dielectric block,
• a film layer composed of a clad layer which is formed on a first face of the dielectric block and an optical waveguide layer which is formed on the clad layer and is brought into contact with a sample,
• a light source which emits a light beam,
• an optical system which causes the light beam to enter the dielectric block through a second face thereof so that the light beam is reflected in total internal reflection at the interface of the dielectric block and the metal film and various angles of incidence of the light beam to the interface of the dielectric block and the metal film can be obtained, and
• a photodetector means which detects attenuation in total internal reflection due to excitation of waveguide mode in the optical waveguide layer by detecting the intensity of the light beam which is reflected in total internal reflection and goes outside the dielectric block through a third face thereof,
• the measuring chip comprising a single dielectric block having all the first to third faces and the clad layer and the waveguide layer integrally formed on the first face of the dielectric block.