Method and apparatus for correction of microbolometer output
AssigneeInfrared Components Corporation
InventorsJonathan P. Knauth, Steven M. Balick
Life of this patent
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Abstract
A method and apparatus for correction of temperature-induced variations in the analog output characteristics of a microbolometer detector in an infrared detecting focal plane array utilizing electronic means to correct for the temperature variation of the individual microbolometer detector. The electronic circuitry and associated software necessary for implementation is also described.
Claims28
A method of correcting the output of a microbolometer detector system, said method comprising:
- providing a microbolometer detector system for operation in an ambient temperature range, said microbolometer detector system further comprising at least one microbolometer detector, and an apparatus for reducing thermal noise;
- providing a temperature stabilization system for correcting the temperature variation of the microbolometer detector;
- providing an electronic system for conditioning the output of the microbolometer detector;
- and
- applying a correction factor to the output signal of the microbolometer detector.
A method of correcting the output of a microbolometer detector system, said method comprising:
- providing a microbolometer detector system for operation in an ambient temperature range, said microbolometer detector system further comprising at least one microbolometer detector, and an apparatus for reducing thermal noise;
- providing a temperature stabilization system for correcting the temperature variation of the microbolometer detector;
- providing an electronic system for conditioning the output of the microbolometer detector;
- providing a system for varying the responsivity of the microbolometer;
- applying a correction factor to the output signal of the microbolometer detector.
An apparatus for correction of a microbolometer detector output, said apparatus comprising:
- at least one microbolometer detector;
- a thermal noise reduction system operationally connected to said at least one microbolometer detector;
- an electrical reference circuit connected to said at least one microbolometer detector;
- an output from said electrical reference circuit connected to an input of a signal conditioning circuit;
- and
- an output from said signal conditioning circuit connected to a display device.
Dependencies are inferred from the claim text.