System and methods for the high throughput screening of polymorphs

Abstract

The system includes a synchrotron X-ray source configured to emit an X-ray beam along a beam path. The system also includes a detector, preferably an area detector, such as a CCD detector, disposed in the beam path. The detector is configured to measure diffraction of the X-ray beam caused by a sample. The system additionally includes an automatic sample changer. The automatic sample changer is configured to sequentially position each of plurality of samples into the beam path between the synchrotron X-ray source and the detector. The samples preferably have a mass of about 10 to 100 μgs and are exposed to the X-ray beam for between 5 and 60 seconds before being automatically exchanged with another sample. The method provides that a sample is automatically positioned into an X-ray beam path and irradiated. The diffraction is then detected, the sample removed, and the process repeated for multiple samples.

Dependencies are inferred from the claim text.