Semiconductor device and method of making same
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsHongyong Zhang, Satoshi Teramoto
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AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsHongyong Zhang, Satoshi Teramoto
Estimating the term…
To provide a thin film transistor having a low OFF characteristic and to provide P-channel type and N-channel type thin film transistors where a difference in characteristics of the P-channel type and the N-channel type thin film transistors is corrected, a region 145 having a P-type behavior more potential than that of a drain region 146 is arranged between a channel forming region 134 and the drain region 146 in the P-channel type thin film transistor whereby the P-channel type thin film transistor having the low OFF characteristic can be provided and a low concentration impurity region 136 is arranged between a channel forming region 137 and a drain region 127 in the N-channel type thin film transistor whereby the N-channel type thin film transistor having the low OFF characteristic and where deterioration is restrained can be provided.
A method of manufacturing a semiconductor device comprising the steps of:
A method of making a semiconductor device comprising the steps of:
A method of making a semiconductor device comprising the step of:
Dependencies are inferred from the claim text.