Quantum-confinement stark effect optical modulator
AssigneeFurukawa Electric Co., Ltd.
InventorsSatoshi Arakawa, Akihiko Kasukawa
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Abstract
A quantum confinement Stark effect (QCSE) optical modulator has a ridge stripe including a current confinement structure. The current confinement structure includes an AlInAs layer which is subjected to selective oxidation of Al content in the AlInAs layer. The current confinement structure is such that a pair of Al-oxidized regions of the AlInAs layer sandwiches therebetween a central un-oxidized region.
Claims9
A quantum confinement Stark effect (QCSE) optical modulator comprising a compound semiconductor substrate, and a layer structure formed thereon, said layer structure including an AlGaInAs-based multiple quantum well (MQW), a pair of cladding layers having opposite conductivity types and sandwiching therebetween said MQW, and an Al-containing layer overlying said MQW or formed within one of said cladding layers having a p-type conductivity, said layer structure being configured as a ridge stripe at a portion including said Al-containing layer, said Al-containing layer having a current confinement structure wherein a pair of Al-oxidized regions of said Al-containing layer sandwiches therebetween a central un-oxidized region of said Al-containing layer.
A method for fabricating a quantum confinement Stark effect (QCSE) optical modulator comprising the steps of:
- forming a layer structure on an InP substrate, said layer structure including a multiple quantum well (MQW), pair of cladding layers sandwiching therebetween said MQW and an Al-containing layer overlying said MQW;
- configuring at least a portion of said layer structure including said Al-containing layer to form a ridge stripe;
- and
- selectively oxidizing Al in said Al-containing layer to form a current confinement structure in said ridge structure, said current confinement structure having a pair of Al-oxidized regions of said Al-containing layer sandwiching therebetween an un-oxidized region of said Al-containing layer.
A method for fabricating a semiconductor optical device comprising the steps of:
- forming a first layer structure on first and second areas of an InP substrate, said layer structure in said first area constituting a semiconductor laser device;
- forming an area-selective growth mask on a portion of said first layer structure in said first area of said InP substrate;
- selectively removing said first layer structure to expose said second area of said InP substrate;
- forming a second layer structure on said second area, said second layer including a multiple quantum well (MQW), pair of cladding layers sandwiching therebetween said MQW and an Al-containing layer overlying said MQW;
- configuring at least a portion of said second layer structure including said Al-containing layer to form a ridge structure;
- selectively oxidizing Al in said Al-containing layer to form a current confinement structure in said ridge stripe, said current confinement structure having a pair of Al-oxidized regions of said Al-containing layer sandwiching therebetween an un-oxidized region of said Al-containing layer;
- forming a quantum confinement Stark effect optical modulator including said ridge stripe on said second area.
A method for forming a semiconductor optical device comprising the steps of:
- forming an area-selective growth mask on an InP substrate;
- selectively growing a layer structure by using said area-selective growth mask, said layer structure including a multiple quantum well (MQW), and a pair of cladding layers sandwiching therebetween said quantum well on said InP substrate;
- consecutively forming an Al-containing layer and at least another cladding layer on said layer structure;
- configuring said a portion of said layer structure including said Al-containing layer to form a ridge stripe;
- and
- selective oxidizing Al in said Al-containing layer to form a current confinement structure in said Al-containing layer, said current confinement structure including a pair of Al-oxidized regions sandwiching therebetween an un-oxidized region;
- said selectively growing step except for the step of growing well layers in said MQW using a material gas including an etchant for removing polycrystalline substance formed on said area-selective growth mask.
Dependencies are inferred from the claim text.