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US 2001/0033362 A1Published application
Combination advanced corneal topography/wave front aberration measurement
AssigneeLaserSight Technologies, Inc.
InventorEdwin J. Sarver
Life of this patent
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Abstract
A method and apparatus for the simultaneous measurement of the anterior and posterior corneal surfaces, corneal thickness, and optical aberrations of the eye. The method employs direct measurements and ray tracing to provide a wide range of measurements for use by the ophthalmic community.
Claims6
A method for measuring a front surface of a cornea, comprising:
- directing a light pattern toward a cornea;
- and
- viewing a reflection of said light pattern off said cornea from a plurality of directions substantially simultaneously;
- whereby horizontal limbus-to-limbus coverage is provided.
1 more element
Apparatus for measuring a front surface of a cornea, comprising:
- means for directing a light pattern toward a cornea;
- and
- means for viewing a reflection of said light pattern off said cornea from a plurality of directions substantially simultaneously;
- whereby horizontal limbus-to-limbus coverage is provided.
1 more element
Dependencies are inferred from the claim text.