Method and device for testing electronic components
AssigneeInfineon Technologies AG
InventorJens Polney
Life of this patent
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Abstract
A method for testing electronic components includes the step of outputting test output data for the tested electronic components on a test board without activating individual scan lines or individual scan signals. Starting from a first activated electronic component successively the following electronic components are activated one after another by passing an activation signal from electronic component to electronic component. A device for testing electronic components is also provided.
Claims24
A method for testing a plurality of electronic components, the method which comprises:
- carrying out at least one test of a plurality of electronic components;
- causing the electronic components to output output data relating to a respective test result;
- recording the output data which are output by the electronic components;
- starting the recording of the output data by feeding a primary output initiation signal to a first one of the electronic components in order to cause the first one of the electronic components to output a first portion of the output data;
- and
- continuing the recording of the output data for further ones of the electronic components by feeding a respective output initiation signal, which is not directly dependent on the primary output initiation signal and corresponds to a status signal of a preceding one of the electronic components, to a following one of the electronic components in order to induce the following one of the electronic components to output a further portion of the output data, such that the output data of the electronic components is recorded, in response to the primary output initiation signal, until the output data of all the electronic components are output and recorded.
A device for testing a plurality of electronic components, comprising:
- a testing configuration for performing at least one test to be carried out on a plurality of electronic components, said testing configuration including a first line device and further line devices;
- said first line device to be connected to a first one of the electronic components and providing a primary output initiation signal to the first one of the electronic components for causing the first one of the electronic component to output first output data;
- and
- said further line devices being provided for further ones of the electronic components, each of said further line devices supplying, to a respective following one of the electronic components, an output initiation signal, which is not directly dependent on the primary output initiation signal and corresponds to a status signal of a preceding one of the electronic components, for causing the following one of the electronic components to output further output data such that output data of all of the electronic components is output to be recorded in response to the primary output initiation signal provided from said first line device.
Dependencies are inferred from the claim text.