Semiconductor laser device having strain buffer layer between compressive-strain quantum well layer and tensile-strain barrier layer
AssigneeFuji Photo Film Co., Ltd.
InventorsToshiaki Fukunaga, Mitsugu Wada
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AssigneeFuji Photo Film Co., Ltd.
InventorsToshiaki Fukunaga, Mitsugu Wada
Estimating the term…
In a semiconductor laser device, an active region includes alternating layers of at least one quantum well layer and a plurality of barrier layers, where two of the plurality of barrier layers are the outermost layers of the alternating layers, each of the at least one quantum well layer has a first thickness da and a compressive strain Δa, and each of the plurality of barrier layers has a second thickness db and a tensile strain Δb. In the active region, a strain buffer layer is formed between each quantum well layer and each of two barrier layers adjacent to the quantum well layer, where each strain buffer layer has a third thickness dr and an intermediate strain Δr which is between the compressive strain Δa and the tensile strain Δb. The first thickness da, the compressive strain Δa, the second thickness db, the tensile strain Δb, the third thickness dr, and the intermediate strain Δr satisfy a relationship, 0≦N·Δa·da+(N+1)·Δb·db+2N·Δr·dr≦0.08 nm, where N is the number of the at least one quantum well layer.
A semiconductor laser device comprising an active region which includes alternating layers of at least one quantum well layer and a plurality of barrier layers, where two of the plurality of barrier layers are outermost layers of said alternating layers, each of said at least one quantum well layer has a first thickness da and a compressive strain Δa, and each of said plurality of barrier layers has a second thickness db and a tensile strain Δb;
Dependencies are inferred from the claim text.