Non-destructive inspection device
AssigneeNsk Ltd.
InventorMakoto Arai
Life of this patent
Estimating the term…
Abstract
In a non-destructive inspection device of the present invention which detects in a non-destructive manner a defect of a member to be inspected, based on a change in magnetic fluxes due to eddy currents that are generated by an inspection probe having a coil, a driving section which adjusts a position of the inspection probe, and measuring device for, based on a detection signal of the inspection probe, measuring a lift-off between the inspection probe and the member to be inspected are disposed. The driving section is controlled in accordance with a result of measurement of the measuring device, whereby a control of making the lift-off constant is performed.
Claims9
A non-destructive inspection device for detecting a defect of a member to be inspected, comprising:
- an inspection probe which is opposed to a surface of said member to be inspected, detects said defect and outputs a detection signal;
- a controller which inputs said detection signal from said inspection probe and measures a lift-off between said inspection probe and said member to be inspected on the basis of said change in magnetic fluxes of eddy currents due to said inspection probe.
Dependencies are inferred from the claim text.