Apparatus for manufacturing a semiconductor device in a CVD reactive chamber
AssigneeKabushiki Kaisha Toshiba
InventorYuichi Mikata
Life of this patent
Estimating the term…
Loading patent…
AssigneeKabushiki Kaisha Toshiba
InventorYuichi Mikata
Estimating the term…
In a method of producing a semiconductor apparatus, when a thin film is formed on a semiconductor substrate in the CVD reactive chamber by the CVD method, a remaining region is provided where a gas for film formation remains to a proximity of a surface of the semiconductor substrate, and a CVD thin film is provided on the substrate by decomposing only the gas for film formation existing in the remaining region without supplying an additional gas from the outside of the remaining region to the remaining region. With the method, when the thin film is formed on the substrate by the CVD method, the thin film is efficiently deposited on the substrate in a reactive chamber by efficiently using a reactive gas for film formation introduced into a CVD reactive chamber, to thereby reduce cost of forming the thin film remarkably.
A method of producing a semiconductor apparatus, when a thin film is formed by a CVD method on a semiconductor substrate in a CVD reactive chamber, said method comprising the steps of:
A semiconductor production equipment, comprising:
A semiconductor production equipment, comprising:
A semiconductor production equipment, comprising:
A semiconductor production equipment, comprising:
A method of producing a semiconductor apparatus, wherein when a surface of a semiconductor substrate is etched in an etching chamber, a remaining region where an etching gas remains in a proximity of the surface of the substrate, is provided, and the surface of the semiconductor substrate is etched only by the etching gas existing in the remaining region without supplying an additional etching gas from the outside of the remaining region to the remaining region.
A method of cleaning a semiconductor production equipment, wherein when a deposit which is deposited on an inner wall surface of a semiconductor substrate processing chamber is removed by etching, after an etching gas for removing a deposit is introduced into the processing chamber, the etching gas remains in the processing chamber, and the deposit is removed by etching without supplying an additional etching gas from the outside.
Dependencies are inferred from the claim text.