Semiconductor photodetector
AssigneeNEC Corporation
InventorAtsuhiko Kusakabe
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Abstract
The present invention provides an optical waveguide structure comprising plural periods of a multi-layered structure which comprises an InGaAs optical absorption layer of a first conductivity type, a pair of first and second InGaAsP cladding layers of the first conductivity type sandwiching the InGaAs optical absorption layer, and a pair of a first InP layer of the first conductivity type and a second InP layer of a second conductivity type, and the first and second InP layers sandwiching the first and second InGaAsP cladding layers.
Claims12
An optical waveguide structure comprising plural periods of a multi-layered structure which comprises an InGaAs optical absorption layer of a first conductivity type, a pair of first and second InGaAsP cladding layers of said first conductivity type sandwiching said InGaAs optical absorption layer, and a pair of a first InP layer of said first conductivity type and a second InP layer of a second conductivity type, and said first and second InP layers sandwiching said first and second InGaAsP cladding layers.
A semiconductor photodetector comprising:
- a pair of a p-electrode and an n-electrode;
- a substrate;
- and
- an optical waveguide structure electrically connected between said p-electrode and said n-electrode and provided over said substrate,
- wherein said optical waveguide structure comprises plural periods of a multi-layered structure which comprises an InGaAs optical absorption layer of a first conductivity type, a pair of first and second InGaAsP cladding layers of said first conductivity type sandwiching said InGaAs optical absorption layer, and a pair of a first InP layer of said first conductivity type and a second InP layer of a second conductivity type, and said first and second InP layers sandwiching said first and second InGaAsP cladding layers.
Dependencies are inferred from the claim text.