Semiconductor integrated circuit
AssigneeHitachi, Ltd.
InventorsMichiaki Nakayama, Hideki Sakakibara, Toru Kobayashi, Shuichi Miyaoka, Yuji Yokoyama, Hideo Sawamoto, Masaji Kume
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AssigneeHitachi, Ltd.
InventorsMichiaki Nakayama, Hideki Sakakibara, Toru Kobayashi, Shuichi Miyaoka, Yuji Yokoyama, Hideo Sawamoto, Masaji Kume
Estimating the term…
The throughput of external output actions of read data from memory blocks that are capable of parallel operation is improved. Read buffers (RB0-RB3) capable of holding the respective read data read out from a plurality of memory blocks (BNK0-BNK7) capable of parallel operation in response to an external-output-incapable state in which the read data cannot be externally outputted from an external interface means, and selection means (40, 41, 42) for selecting the read data read out from one of said memory blocks or the read data read out from one of said read buffers, and feeding it to said external interface means while said external-output-incapable state is not present, are provided. In this way, where there is a possibility of an output action of the read data causing a resource competition, this read data is stored in a read buffer, and where there is no such possibility, then the read data can be externally outputted directly, thereby improving the throughput of read data output actions.
A semiconductor integrated circuit comprising;
A semiconductor integrated circuit comprising;
A semiconductor integrated circuit comprising;
A semiconductor integrated circuit comprising;
A semiconductor integrated circuit comprising;
A semiconductor integrated circuit comprising;
A semiconductor integrated circuit according to one of claims 5 through 9 wherein said memory blocks are DRAMs and said read buffer and said write buffer are SRAMs.
A semiconductor integrated circuit comprising;
A semiconductor integrated circuit comprising;
A semiconductor integrated circuit comprising;
Dependencies are inferred from the claim text.