System and method for detecting defects within an electrical circuit by analyzing quiescent current

A method for detecting defects within circuits, the method comprising the steps of:

• providing a circuit;
• measuring a value of a supply current associated with said circuit when said circuit is in a first state;
• determining a threshold value based on said value of said supply current measured in said measuring step;
• receiving a signal indicating another value of said supply current when said circuit is in a second state;
• comparing said signal to said threshold value;
• and
• detecting a defect in said circuit based on said comparing step.

A method for detecting defects within circuits, the method comprising the steps of:

• providing a plurality of circuits;
• producing signals indicating values of supply currents associated with said circuits;
• analyzing values of said signals;
• determining a constant value based on said analyzing step;
• selecting a circuit;
• placing said circuit into a first state subsequent to said determining step;
• producing a first signal indicating a first value of a supply current of said circuit when said circuit is in said first state;
• determining a threshold value based on said constant value and said first signal;
• placing said first circuit into another state;
• producing a second signal indicating a second value of said supply current when said circuit is in said other state;
• and
• determining whether a value of said second signal exceeds said first threshold value.