System and method for parallel RF transceiver testing and characterization
AssigneeTexas Instruments Incorporated
InventorXiaobo An
Life of this patent
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Abstract
A test system includes a test instrument with a signal terminal, a splitter having a splitter input connected to the signal terminal and multiple splitter outputs, multiple test channels, each including a socket with a socket terminal connected to a respective one of the splitter outputs to couple a transceiver terminal of an installed electronic device under test (DUT) to the respective splitter output, and a controller configured to operate the test instrument to concurrently test transceiver circuits of the installed DUTs at respective unique subcarriers of an OFDM signal at the signal terminal.
Claims20
A test system, comprising:
- a test instrument having a signal terminal;
- a splitter having a splitter input connected to the signal terminal of the test instrument and an integer number N splitter outputs, N being greater than 1;
- test channels, each test channel including a socket with a socket terminal connected to a respective one of the splitter outputs to couple a transceiver terminal of an installed electronic device under test (DUT) to the respective splitter output;
- and
- a controller configured to operate the test instrument to concurrently test transceiver circuits of the installed DUTs at respective unique subcarriers of an OFDM signal at the signal terminal.
A method of fabricating an electronic device, the method comprising:
- installing manufactured electronic devices in respective sockets with a transceiver circuit of each respective electronic device connected to a respective splitter output of a splitter;
- operating a single test instrument to concurrently test the transceiver circuits of the installed electronic devices at respective unique subcarriers of an OFDM signal at a signal terminal of the test instrument.
Dependencies are inferred from the claim text.