Method of determining illumination pattern for three-dimensional scene and method and apparatus for modeling three-dimensional scene
AssigneesSamsung Electronics Co., Ltd., Postech Research and Business Development Foundation
InventorsSeung-Hwan Baek, Seokjun Choi, Seungwoo Yoon, Seungyong Lee, Jinwoo Park, Nahyup Kang, Jiyeon Kim
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