Error rate measurement apparatus and signal detection method
AssigneeAnritsu Corporation
InventorsHironori Yoshioka, Tatsuya Iwai
Life of this patent
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AssigneeAnritsu Corporation
InventorsHironori Yoshioka, Tatsuya Iwai
Estimating the term…
There is provided an error rate measurement apparatus including: a display unit; a reference signal holding unit that holds a part of a head of the internal signal as a reference signal; a head detection unit that detects a head of the specific pattern in an input signal from the DUT by comparing the reference signal with the input signal; a detection signal output unit that outputs a detection signal synchronized with a timing at which the head of the specific pattern is detected by the head detection unit; a latch unit that holds the detection signal; and a control unit that displays a detection notification image indicating that the head of the specific pattern is detected by the head detection unit, on the display unit, during a period in which the detection signal is held by the latch unit.
An error rate measurement apparatus for measuring an error rate of an input signal from a device under test (DUT), the error rate measurement apparatus comprising:
A signal detection method executed by an error rate measurement apparatus for measuring an error rate of an input signal from a device under test (DUT), the method comprising:
Dependencies are inferred from the claim text.