Methods and apparatus to characterize memory
AssigneeTexas Instruments Incorporated
InventorDevanathan Varadarajan
Life of this patent
Estimating the term…
Abstract
An example device includes: converter circuitry having an output configured to couple to a first memory circuit from a plurality of memory circuits, the converter circuitry configured to: receive a first instruction formatted with a uniform protocol; and convert the first instruction from the uniform protocol to a protocol specific to the first memory circuit; logic circuitry having an input configured to couple to the first memory circuit, the logic circuitry configured to: receive a first result of the first instruction from the first memory circuit; and responsive to a second instruction, combine the first result with other results from ones of the plurality of memory circuits into an output.
Claims20
A device, comprising:
- a first circuit configured to:
- receive a first result from a first memory circuit;
- receive a second result from a second memory circuit;
- and
- combine the first and second results to generate a combined result;
- and
- a second circuit configured to:
- determine a measured signature based on the combined result;
- and
- determine whether a fault exists in at least one of the first memory circuit or the second memory circuit based on a comparison of the measured signature with an expected signature.
A method, comprising:
- receiving a first result from a first memory circuit and a second result from a second memory circuit;
- combining the first and second results to generate a combined result;
- determining a measured signature based on the combined result;
- and
- determining whether a fault exists in at least one of the first memory circuit or the second memory circuit based on a comparison of the measured signature with an expected signature.
Dependencies are inferred from the claim text.