US 12,761,810 B2 · Bit flipping decoder threshold controlling for error correction in memory devices

Abstract

This application is directed to correcting errors in a data block. Data bits of the data block correspond to variable nodes and check nodes. For each check node, an electronic device determines check node data indicating whether respective variable nodes satisfy a data validity condition. For a first variable node, the electronic device determines a conversion factor indicating a quality of the check node data of the check nodes with reference to variable node data of the first variable node, identifies a first set of check nodes for which the variable node data of the first variable node are applied to determine the check node data of each of the first set of check nodes, determines a flip threshold based on the conversion factor, and determines whether to flip the first variable node based on the flip threshold and the check node data of the first set of check nodes.

Claims20

Dependent claims

A method for correcting data errors, comprising:

obtaining a data block including a plurality of data bits;
identifying a plurality of variable nodes and a plurality of check nodes, wherein each of the plurality of variable nodes corresponds to a distinct data bit of the plurality of data bits;
for each of the plurality of check nodes, determining check node data indicating whether a respective set of variable nodes satisfies a data validity condition;
and
for a first variable node:
identifying a first set of check nodes for which variable node data of the first variable node is applied to determine the check node data of each of the first set of check nodes;
determining a conversion factor indicating a quality of the check node data of the first set of check nodes with reference to the variable node data of the first variable node;
determining a flip threshold based on the conversion factor;
and
determining whether to flip the first variable node based on the flip threshold and the check node data of the first set of check nodes.

7 more elements

An electronic device, comprising:

one or more processors;
and
memory storing one or more programs for execution by the one or more processors, the one or more programs including instructions for:
obtaining a data block including a plurality of data bits;
identifying a plurality of variable nodes and a plurality of check nodes, wherein each of the plurality of variable nodes corresponds to a distinct data bit of the plurality of data bits;
for each of the plurality of check nodes, determining check node data indicating whether a respective set of variable nodes satisfies a data validity condition;
and
for a first variable node:
determining a conversion factor indicating a quality of the check node data of the plurality of check nodes with reference to variable node data of the first variable node;
identifying a first set of check nodes for which the variable node data of the first variable node is applied to determine the check node data of each of the first set of check nodes;
determining a flip threshold based on the conversion factor;
and
determining whether to flip the first variable node based on the flip threshold and the check node data of the first set of check nodes.

10 more elements

A non-transitory computer-readable storage medium storing one or more programs for execution by one or more processors, the one or more programs comprising instructions for:

obtaining a data block including a plurality of data bits;
identifying a plurality of variable nodes and a plurality of check nodes, wherein each of the plurality of variable nodes corresponds to a distinct data bit of the plurality of data bits;
for each of the plurality of check nodes, determining check node data indicating whether a respective set of variable nodes satisfies a data validity condition;
and
for a first variable node:
determining a conversion factor indicating a quality of the check node data of the plurality of check nodes with reference to variable node data of the first variable node;
identifying a first set of check nodes for which the variable node data of the first variable node is applied to determine the check node data of each of the first set of check nodes;
determining a flip threshold based on the conversion factor;
and
determining whether to flip the first variable node based on the flip threshold and the check node data of the first set of check nodes.

7 more elements

Dependencies are inferred from the claim text.

Bit flipping decoder threshold controlling for error correction in memory devices

Life of this patent

Bit flipping decoder threshold controlling for error correction in memory devices

Life of this patent

Abstract

Claims20