Failure detection circuit, semiconductor device and failure detection method

A failure detection method by a failure detection circuit provided in a target circuit having a first circuit area that operates in synchronization with a first clock signal, the failure detection method comprising:

• outputting, by using a first detection circuit, a first detection result obtained by transitioning a voltage level in synchronization with the first clock signal,
• outputting, by using a second detection circuit, a second detection result obtained by transitioning the voltage level in synchronization with the first clock signal,
• outputting, by using a first comparison circuit, a first comparison result by comparing the first detection result and the second detection result,
• wherein the first detection circuit outputs a third detection result obtained by transitioning the voltage level to the first detection result in synchronization with the first clock signal,
• wherein the second detection circuit outputs a fourth detection result obtained by transitioning the voltage level to the second detection result in synchronization with the first clock signal, and
• wherein the first comparison circuit compares the first detection result with the second detection result, further compares the third detection result with the fourth detection result, and outputs the first comparison result.