Wafer test cassette
AssigneeXingr Technologies (Zhejiang) Limited
InventorsChoon Leong Lou, Ho Yeh Chen
Life of this patent
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AssigneeXingr Technologies (Zhejiang) Limited
InventorsChoon Leong Lou, Ho Yeh Chen
Estimating the term…
A wafer test cassette is provided, which includes a first housing, a second housing, and a magnetic barrier assembly. The first housing includes a first magnetic member, and the second housing includes a second magnetic member arranged corresponding to the first magnetic member. The magnetic barrier assembly is configured to be connected to the first housing or the second housing for reducing or eliminating magnetic attraction generated between the first magnetic member and the second magnetic member. The magnetic barrier assembly is configured to reduce or eliminate the magnetic attraction before the first housing and the second housing are in contact with each other. When the first housing and the second housing are correspondingly in contact with each other, an effect of the magnetic barrier assembly is released, so that the first housing and the second housing are tightly coupled to each other through the magnetic attraction.
A wafer test cassette, comprising:
Dependencies are inferred from the claim text.