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US 12,761,262 B2Granted
Method and device for analyzing defects by means of reflectometry using a transfer function estimation
AssigneeCommissariat A L'energie Atomique Et Aux Energies Alternatives
InventorMickaël Cartron
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Abstract
A method and a device for analyzing defects by means of reflectometry which are based on estimating a transfer function at a frequency resolution which is larger than that normally allowed by taking account of the limitations which are intrinsic to analog-to-digital and digital-to-analog converters and notably of their sampling frequencies.
Claims20
A method for analyzing faults by means of reflectometry in a network of transmission lines into which a first test signal is injected beforehand, the method comprising the steps of:
- measuring, with a measurement device, the first test signal after it has propagated through the network of lines,
- digitizing, with an analog-to-digital converter, the signal measured at a first sampling frequency,
- executing with a processor the steps of:
- sampling the first test signal at the first sampling frequency,
- converting the digitized measured signal and the sampled first test signal into the frequency domain,
- determining an estimate of a transfer function of the network by computing a ratio between said signals in the frequency domain,
- generating a second test signal having a second sampling frequency,
- determining frequencies which are present in the second test signal,
- interpolating the estimated transfer function for the frequencies which are present in the second test signal,
- converting the second test signal into the frequency domain,
- computing a product of the interpolated transfer function and of the second test signal in the frequency domain,
- determining an estimate of a measurement of the second test signal after it has propagated through the network of lines by converting a result of said product into a time domain, and
- detecting a fault in the network of transmission lines from the estimate of a measurement of the second test signal.
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