Noise margin measurement of a repeating signal under test (SUT)
AssigneeKeysight Technologies, Inc.
InventorDavid Leyba
Life of this patent
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AssigneeKeysight Technologies, Inc.
InventorDavid Leyba
Estimating the term…
A test system implemented method is for measuring the noise margin of a repeating signal under test (SUT). The method includes determining a digitizer noise of a digitizer channel of the test system, and applying the repeating SUT to the digitizer channel of the test system. An oversampled equivalent-time waveform representation of the repeating SUT is acquired, and then a filtered waveform representation is obtained. A noise margin om of the repeating SUT is determine in accordance with the equation σm=(σc2+σi2−σd2)1/2, where σc is a standard deviation of a maximum amount of gaussian noise that can added to the filtered waveform representation without its symbol error rate (SER) exceeding a target value, σi is a standard deviation of the digitizer noise, and σd is a standard deviation of the noise components removed to obtain the filter waveform representation.
A test system implemented method of measuring the noise margin of a repeating signal under test (SUT), comprising:
A test system implemented method of measuring the noise margin of a repeating signal under test (SUT), comprising:
A non-transitory tangible computer readable medium having stored thereon executable instructions embodied in the computer readable medium that when executed by at least one processor of a test system cause the test system to execute a method of measuring the noise margin of a repeating signal under test (SUT), the method including:
Dependencies are inferred from the claim text.