Testing head with vertical probes for a probe card and corresponding method of assembly
AssigneeMicrotest S.p.A.
InventorGiuseppe Amelio
Life of this patent
Estimating the term…
Abstract
A a testing head with vertical probes for a probe card, including: at least one pair of support and guide plates arranged parallel to each other in a prefixed spaced apart relation and provided with a plurality of guide and housing holes; a plurality of contact probes housed and extended between corresponding holes of the guide plates; at least one additional plate slidingly mounted next to one or the other of the guide plates and provided with one corresponding plurality of holes of the guide plates. The embodiments also relate to a method of assembly of the testing head.
Claims13
A testing head with vertical probes for a probe card, the testing head comprising:
- at least one pair of guide plates arranged parallel to each other in a prefixed, spaced-apart relation, and provided with a plurality of guide and housing holes;
- a plurality of contact probes housed and extended between corresponding holes of said guide plates;
- and
- at least one additional plate slidingly associated next to one or the other of said guide plates and provided with a plurality of openings which define, in continuity with the holes of the associated guide plate, insertion passages for said probes, wherein the sliding of the additional plate with respect to the associated guide plate modifies a minimum section of said insertion passages;
- wherein a narrower section of said openings has an axial extension, measured along a sliding direction of the additional plate, greater than that of the holes of the associated guide plate;
- and
- wherein the guide plate associated with the additional plate comprises first and second plate-shaped portions which are parallel to each other and which are separated by a gap in which said additional plate slides.
A method of assembly of a testing head with vertical probes for a probe card, comprising the steps of:
- providing at least one pair of guide plates arranged parallel to each other in a prefixed, spaced-apart relation, and provided with a plurality of guide and housing holes;
- providing at least one additional plate slidingly associated next to one or the other of said guide plates and provided with a plurality of openings which define, in continuity with the holes of the associated guide plate, insertion passages for probes, wherein the sliding of the additional plate with respect to the associated guide plate modifies a minimum section of said insertion passages;
- bringing said additional plate into a non-operating position, in which a minimum section of said insertion passages is maximum;
- introducing a plurality of contact probes into the corresponding holes of said guide plates, and passing through said insertion passages;
- and
- bringing said additional plate into an operating position, in which a minimum section of said insertion passages, within which the probes are housed, is minimum;
- wherein a narrower section of said openings has axial extension, measured along a sliding direction of the additional plate, greater than that of the holes of the associated guide plate;
- and
- wherein the guide plate associated with the additional plate comprises first and second plate-shaped portions which are parallel to each other and which are separated by a gap in which said additional plate slides.
Dependencies are inferred from the claim text.