Probe card for electrically connecting test target and circuit to generate a test signal

A probe card for electrically connecting a test target and a circuit configured to generate a test signal, the probe card comprising:

• a plurality of conductive contact probes;
• a probe head configured to accommodate ends of the plurality of conductive contact probes so as to freely extend and retract with respect to an outside;
• a laminated member laminated on the probe head on a side opposite to a side of the probe head in which the conductive contact probes extend outwardly;
• and
• a fastening member including a screw and a nut configured to fasten the probe head and the laminated member to each other, the screw including
• a head provided on the side of the probe head in which the conductive contact probes extend outwardly, and
• a shaft inserted through the probe head and the laminated member, the shaft extending and having a diameter smaller than a diameter of the head, wherein
• the shaft is fixed to the probe head, is threadedly connected to the nut on an end side opposite to the head side, and is configured to fasten the probe head and the laminated member to each other, and
• the probe head includes
• a main body, and
• a holding portion provided inside the probe head, the holding portion including an insertion hole through which the shaft is inserted and having rigidity higher than the main body.