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US 12,761,244 B2Granted
Portable probe card assembly having a probe card, method for assembling the portable probe card assembly, and method for cleaning the probe card
AssigneeCeladon Systems, Inc.
InventorsWilliam A. Funk, Garrett Tranquillo, Riley Kaiser
Life of this patent
Estimating the term…
Abstract
This disclosure relates generally to test equipment, apparatuses, and systems for a device under test, such as, but not limited to, a semiconductor device. More specifically, this disclosure relates to test equipment, apparatuses, and systems that are portable for use in atypical testing environments.
Claims20
A test assembly for testing a device under test, comprising:
- a base plate including a test site;
- a top plate;
- and
- a probe card, the probe card secured to the top plate and extending through the top plate, the probe card being configured to contact the device under test disposed on the test site,
- wherein the base plate includes a flexible member and one or more pockets disposed in the flexible member,
- the test site is disposed within a perimeter of the flexible member, and the test site is configured to support the device under test, and
- the flexible member is configured to provide Z positioning and control.
4 more elements
A method of assembling a test assembly, the method comprising:
- installing a probe card onto a top plate;
- installing the top plate including the probe card onto a base plate;
- supporting a device under test on a test site that is disposed within a perimeter of a flexible member of the base plate;
- inserting fasteners through adjustable rigid stops included in the top plate and aligning the fasteners with one or more apertures in the flexible member of the base plate, to provide Z positioning and control;
- and
- tightening fasteners to secure the test assembly having the top plate and the base plate.
3 more elements
A method for cleaning a probe tip of a probe card, the method comprising:
- inserting fasteners through adjustable rigid stops included in a top plate and aligning the fasteners with one or more apertures in a cleaning plate, to provide Z positioning and control;
- installing the top plate onto the cleaning plate;
- installing the probe card onto the top plate;
- tightening the fasteners to secure a cleaning assembly having the top plate and the cleaning plate;
- pushing the probe card against the cleaning plate;
- and
- scrubbing the probe tip of the probe card against the cleaning plate.
4 more elements
Dependencies are inferred from the claim text.