Back to results
US 12,761,174 B2Granted
Variable detector amplifier settling time
AssigneeThermo Enviromental Instruments LLC
InventorsRobert Wright, Nigel Johnson
Life of this patent
Estimating the term…
Abstract
A mass spectrometer system including a non-transitory computer readable medium is described. The non-transitory computer readable medium includes instructions, which, when executed by one or more hardware processors, cause the mass spectrometer to allow an amplifier current to settle, for a time determined by a threshold current, between generating signals due to an ion current from the mass spectrometer's detector.
Claims21
A system (100) comprising:
- a mass spectrometer (102) comprising a mass filter (104), and a current amplifier (108) coupled to a detector (106), wherein the current amplifier (108) comprises an amplifier current;
- and
- a non-transitory computer readable medium (110) coupled to or included with the mass spectrometer (102), the non-transitory computer readable medium (110) comprising instructions, which, when the instructions are executed by one or more hardware processors (112), cause the mass spectrometer (102) to:
- send an ion beam through the mass filter (104);
- set the mass filter (104) to a 1st mass filter setting, thereby focusing a 1st subset of ions from the ion beam onto the detector (106);
- generate a 1st signal proportional to the 1st subset of ions focused onto the detector (106);
- set the mass filter (104) to a 2nd mass filter setting, thereby focusing a 2nd subset of ions from the ion beam onto the detector (106);
- allow the amplifier current to settle for a first time determined by a threshold current;
- generate a 2nd signal proportional to the 2nd subset of ions focused onto the detector (106);
- generate mass/charge to ion intensity data using the 1st and 2nd mass filter settings and the corresponding 1st and 2nd signals.
7 more elements
A method of measuring mass distributions in a sample, the method comprising:
- sending an ion beam through a mass filter;
- setting the mass filter to a 1st mass filter setting, thereby focusing a 1st subset of ions from the ion beam onto a detector;
- generating a 1st signal proportional to the 1st subset of ions focused at the detector;
- setting the mass filter to a 2nd mass filter setting, thereby focusing a 2nd subset of ions from the ion beam onto the detector;
- allowing an amplifier current to settle for a first time determined by a threshold current;
- generating a 2nd signal proportional to the 2nd subset of ions focused at the detector;
- and
- generating mass/charge to ion intensity data using the 1st and 2nd mass filter settings and the corresponding 1st and 2nd signals.
5 more elements
Dependencies are inferred from the claim text.