PDMS (poly(dimethyl siloxane))-based analysis method of cosmetic film formulation
AssigneesAmorepacific Corporation, Research & Business Foundation Sungkyunkwan University
InventorsChaeyeon Song, Marta Goncalves, Byung Mook Weon, Youngkyu Han
Life of this patent
Estimating the term…
Abstract
Disclosed in the present specification is a technology for quantifying properties of a cosmetic film formulation using a cosmetic film applied on a polymeric substrate having physical properties similar to skin, and for quantifying the degree of deformation due to application of a cosmetic composition using a non-destructive analysis technique through X-ray CT, thereby objectively quantifying the degree of pulling of the cosmetic film using this technology.
Claims15
A PDMS (poly(dimethyl siloxane))-based method of analyzing a cosmetic film formulation, the method comprising:
- preparing a PDMS substrate;
- applying a cosmetic composition to the PDMS substrate to form a cosmetic film;
- and
- analyzing, using X-ray computed tomography (X-ray CT), a degree of deformation of the PDMS substrate on which the cosmetic film is formed.
An artificial skin for cosmetic film formulation analysis comprising:
- a poly(dimethyl siloxane) (PDMS) substrate with a micropillar pattern formed on an upper portion thereof,
- wherein the cosmetic film formulation analysis is quantifying a degree of pulling of a cosmetic film.
Dependencies are inferred from the claim text.