X-ray inspection system and control architecture for an x-ray inspection system

An x-ray inspection system comprising:

• an x-ray source configured to illuminate an object to be inspected by the x-ray inspection system;
• a plurality of detector elements for detecting x-rays, the detector elements being positioned to detect x-rays from an inspection area, the plurality of detector elements being provided in at least one detector assembly configured to be secured to a gantry about the inspection area, wherein
• the at least one detector assembly comprises:
• an analogue-to-digital converter, ADC, and
• a detector line control unit, COB.
• wherein the ADC is configured to provide raw data, digitized from electrical signals obtained from the plurality of detector elements, to the COB;
• and
• a control logic module for performing data acquisition and control of the x-ray inspection system, the control logic module comprising:
• an x-ray source interface configured to provide and receive first control signals to and from the x-ray source to cause the x-ray source to illuminate an object to be inspected by the x-ray inspection system;
• and
• a detector element interface configured to provide and receive second control signals and from the plurality of detector elements separate from the control logic module, via the COB, wherein the COB is configured to obtain the second control signals from the control logic module and to synchronize operation of the ADC with the second control signals from the control logic module,
• wherein the control logic module is configured to be mounted in a control assembly of the system,
• wherein the detector element interface is configured to be connected to the plurality of detector elements, which are configured to be provided in the at least one detector assembly configured to be secured to a gantry about an inspection area, via wiring connections of a wiring harness secured to said gantry,
• wherein the control assembly is separate from each of the at least one detector assembly and is provided enclosed in a separate housing from a housing of each of the at least one detector assembly,
• wherein the control logic module is configured to provide and receive said first and second said control signals to synchronize operation of the detector elements with operation of the x-ray source, the control logic module further comprising at least one peripheral interface configured to provide control signals to and to receive control signals from a peripheral device of the x-ray inspection system, wherein the peripheral device comprises an image processing system, IPS, configured to process data obtained from the detector assemblies for image reconstruction and analysis,
• wherein the COB is configured to encode the raw data from the electrical signals from the plurality of detector elements for transmission to the IPS, for image reconstruction and analysis,
• wherein the control logic module is configured to provide imaging parameter data to the IPS and/or to obtain control signals from the IPS for controlling imaging of the object in the inspection area.