Back to results
US 12,760,413 B2Granted
Film forming method, film forming system, and film forming apparatus
AssigneeTokyo Electron Limited
InventorsKatsumasa Yamaguchi, Koji Maekawa, Takashi Sameshima, Shigeru Nakajima
Life of this patent
Estimating the term…
Abstract
A film forming method includes a step of disposing a substrate on which an insulating film is formed in a processing container and forming a base film by repeatedly supplying a Ti-containing gas, an Al-containing gas, and a reaction gas into the processing container under a decompressed atmosphere; and a step of forming a metal layer made of a metal material on the substrate on which the base film is formed.
Claims16
A film forming method comprising:
- disposing a substrate on which an insulating film is formed in a processing container and forming a base film by repeatedly supplying a Ti-containing gas, an Al-containing gas, and a reaction gas into the processing container under a decompressed atmosphere;
- and
- forming a metal layer made of a metal material on the substrate on which the base film is formed,
- wherein the forming the base film comprises forming the base film by setting a supply amount of the Ti-containing gas to be larger than a supply amount of the Al-containing gas when forming a lower portion of the base film, and setting the supply amount of the Ti-containing gas to be smaller than the supply amount of the Al-containing gas when forming an upper portion of the base film,
- wherein a content rate of Al in the base film is 50% or more and less than 100%, and
- wherein the forming the base film comprises at least once repeating:
- forming a first base film by repeating an alternating supply of the Ti-containing gas and the reaction gas at least once with a purge step interposed therebetween;
- and
- forming a second base film by repeating an alternating supply of the Al-containing gas and the reaction gas at least once with a purge step interposed therebetween.
6 more elements
Dependencies are inferred from the claim text.