Drawing data examination method, drawing method, drawing apparatus, and non-transitory storage medium

A drawing apparatus configured to examine drawing data of a figure expressed by a B-spline curve, the drawing apparatus comprising:

• processing circuitry configured to:
• acquire coordinates representing positions of a plurality of control points forming the B-spline curve;
• set, as an examination target region of the drawing data, a region surrounded by line segments connecting at least three or more control points adjacent to each other in the drawing data with straight lines after acquiring the coordinates;
• perform calculation processing of specifying a relative position of an examination target control point with respect to the examination target region by using the coordinates of the examination target control point and control points of the examination target region with respect to the examination target region;
• and
• determine whether the drawing data passed or failed an examination by determining whether the examination target control point exists inside the examination target region based on the relative position.

A non-transitory storage medium storing a program causing a computer to implement:

• processing of acquiring coordinates representing positions of a plurality of control points forming a B-spline curve expressing a figure of drawing data used by a drawing apparatus;
• processing of setting, as an examination target region of the drawing data, a region surrounded by line segments connecting at least three or more control points adjacent to each other in the drawing data with straight lines after acquiring the coordinates;
• calculation processing of specifying a relative position of an examination target control point with respect to the examination target region by using the coordinates of the examination target control point and control points of the examination target region with respect to the examination target region;
• and
• processing of determining whether the drawing data passed or failed an examination by determining whether the examination target control point exists inside the examination target region based on the relative position.